Detection and Diagnosis of Multi-Fault for through Silicon Vias in 3D IC

Shang, YL; Tan, WP; Li, CQ; Fan, HH; Zeng, LZ

Li, CQ (corresponding author), Guilin Univ Elect Technol, Sch Mech & Elect Engn, Guilin 541004, Peoples R China.

JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2020; 36 (6): 771