期刊： JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2021; 37 (2)
A triple modular redundancy SRAM was designed as the embedded high-speed memory for a radiation-tolerant ARM processor with ST Microelectronics 28-nm ......
期刊： JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2021; 37 (2)
In this paper, eight different SRAM cells are studied and evaluated with a 65nm CMOS technology. The cells were designed with radiation-hardening-by-d......
期刊： JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2021; 37 (2)
Radio Frequency (RF) analog circuit failures often occur in broadband, high voltage and high temperature environment, so how to determine fault locati......
期刊： JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2021; 37 (2)
In view of the fact that the traditional Hardware Trojan (HT) implanting method will increase the number of logic gates, and the power consumption cha......
期刊： JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2021; 37 (1)
In the traditional single particle fault injection experiments (SPFIE), when the target configuration register for fault injection is selected, the st......
期刊： JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, ; ()
Digital microfluidic biochips (DMFBs) are widely used in the field of biochemistry. Effective off-line and on-line test for the biochips are required ......
期刊： JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, ; ()
Detecting lithographic hotspots is significant for VLSI fabrication before transferring the designed circuit layout pattern to silicon. However, the c......
期刊： JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2020; 36 (4)
Considering the problem to diagnose incipient faults in nonlinear analog circuits, a novel approach of fault feature-extracting based on HMFT (high or......
期刊： JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2020; 36 (4)
With the technology node scaling down into nanometer range, the effect of parasitic inductance and capacitance between the interconnect lines on predi......
期刊： JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2020; 36 (4)
Radiation-induced single transient faults (STFs) are expected to evolve into multiple transient faults (MTFs) at nanoscale CMOS technology nodes. For ......
期刊： JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2020; 36 (5)
Considering the shortcomings of the existing test methods, this paper provides a new procedure for validating the requirements on the repetition rate ......
期刊： JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2020; 36 (5)
Hardware Trojan (HT) is increasingly becoming a major threat in the filed of hardware security. Recently, researchers are taking a high value on the s......
期刊： JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2020; 36 (1)
Test selection is an important process to simplify the system structure and build a diagnostic system. Test selection problem in a multi-path system w......
期刊： JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2020; 36 (6)
Through silicon via (TSV) is the enabling technology for three-dimensional integrated circuit (3D IC) realization. During the TSV manufacturing proces......
期刊： JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2020; 36 (2)
Digital microfluidic biochips (DMFBs) have been widely used in biochemical experiments with high safety requirements. To ensure the reliability of the......
