GetPortalImpactFactorByIdResp(projectId=1, id=445e3705, cover=https://img.medsci.cn/images/journal/cover/2021/CJq_202109271315355690.jpg, fullname=JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, abbr=J ELECTRON TEST, pyear=暂无数据, frequence=Bimonthly, articleNumbers=565, citedSelf2015=26.7, acceptanceRate=null, submissionToAcceptance=null, averageReviewTime=暂无数据, reviewFee=null, pageFee=null, publishedRatio=2023年中国人文章占该期刊总数量暂无数据 (2022年为100.00%), issn=0923-8174, greenSci=https://www.greensci.net/search?kw=0923-8174, scijournal=https://www.scijournal.org/impact-factor-of-J-ELECTRON-TEST.shtml, medsciHotlightString=null, medsciHotlightRealtime=1.237, medsciHotlight=0.967, medsciHotlight5year=1.80493, citescore=0.0, hIndex=34, impactFactor=0.9, orgnization=Springer Netherlands, orgnizationUrl=http://springerlink.com, country=Netherlands, countryCn=荷兰, isOa=0, isOaString=否, sciScie=Science Citation Index Expanded|Current Contents - Engineering, Computing &amp; Technology, bigclassCas=工程技术 4区, smallclassCas=工程技术 4 区, website=https://www.springer.com/engineering/circuits+%26+systems/journal/10836, websiteHits=2934, guideForAuthor=null, guideForAuthorHits=1, submitWebsite=https://www.editorialmanager.com/jett/default.aspx, submitWebsiteHits=823, content= Published by Springer. ISSN (printed): 0923-8174. ISSN (electronic): 1573-0727.<br> The Journal of Electronic Testing: Theory and Applications is an international forum for the disse, totalCites=509, brief=J ELECTRON TEST杂志工程技术行业，“<strong><a target="_blank" href="/sci/index.do?smallclass=工程：电子与电气" >工程：电子与电气</a></strong>”子行业的偏低级别杂志, articleType=该刊全部是论著，可能不接收综述类等文章, medsciHeat=<span style="color: #000000;">黑</span>, medsciComment=杂志水平一般，也很冷门，关注人少，审稿周期可能也不一定快，如果文章质量不佳，或时间不紧的话，可以考虑考虑。, medsciExplanation=MedSci期刊指数是根据中国科研工作者（含医学临床，基础，生物，化学等学科）对SCI杂志的认知度，熟悉程度，以及投稿的量等众多指标综合评定而成。当然，具体的，您还可以结合“<a href='https://www.medsci.cn/sci/submit.do?id=445e3705'>投稿经验系统</a>”，进行综合判断，这更是大家的实战经验，值得分享和参考。<br> 注意，上述MedSci期刊指数采用MedSci专利技术，由计算机系统自动计算，并给出建议，存在不准确的可能，仅供您投稿选择杂志时参考。, tags=null, citeScoreList=[GetImpactFactorCiteScoreListResponse(year=2015, citescore=0.74), GetImpactFactorCiteScoreListResponse(year=2017, citescore=0.77), GetImpactFactorCiteScoreListResponse(year=2018, citescore=0.97), GetImpactFactorCiteScoreListResponse(year=2019, citescore=1.6), GetImpactFactorCiteScoreListResponse(year=2020, citescore=0.0)], medsciIndexList=[GetImpactFactorMedsciIndexListResponse(year=2020, medsciHotlight=1.973), GetImpactFactorMedsciIndexListResponse(year=2021, medsciHotlight=1.022), GetImpactFactorMedsciIndexListResponse(year=2022, medsciHotlight=0.864), GetImpactFactorMedsciIndexListResponse(year=2023, medsciHotlight=1.048), GetImpactFactorMedsciIndexListResponse(year=2024, medsciHotlight=1.237)], citeScoreGradeList=[GetImpactFactorCiteScoreGradeResponse(smallClass=Engineering - Electrical and Electronic Engineering , rank=370/661)], totalJcrAreaList=[], pmcUrl=https://www.ncbi.nlm.nih.gov/nlmcatalog?term=0923-8174[ISSN], pubmedUrl=https://www.ncbi.nlm.nih.gov/pubmed?cmd=search&term=JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS[ta], article_number=43, article_number_cn=7, earlyWarning=null, linkOutUrl=null, isJournalMember=false, unscrambleContent=null, dayViewCount=false, endexampletyle=暂无数据)