Diagnosis of Incipient Faults in Nonlinear Analog Circuits Based on High Order Moment Fractional Transform

Deng, Y; Chen, T; Zhang, D

Deng, Y (corresponding author), Southwest Petr Univ, Sch Mechatron Engn, Chengdu 610500, Peoples R China.

JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2020; 36 (4): 485

Abstract

Considering the problem to diagnose incipient faults in nonlinear analog circuits, a novel approach of fault feature-extracting based on HMFT (high or......

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