Within-project and cross-project just-in-time defect prediction based on denoising autoencoder and convolutional neural network

Zhu, K; Zhang, NN; Ying, S; Zhu, DD

Ying, S (corresponding author), Wuhan Univ, Sch Comp Sci, 299 Bayi Rd, Wuhan, Peoples R China.

IET SOFTWARE, 2020; 14 (3): 185