Cross-Project and Within-Project Semisupervised Software Defect Prediction: A Unified Approach

Wu, F; Jing, XY; Sun, Y; Sun, J; Huang, L; Cui, FY; Sun, YF

Wu, F; Jing, XY (reprint author), Nanjing Univ Posts & Telecommun, Coll Automat, Nanjing 210003, Jiangsu, Peoples R China.; Jing, XY (reprint author), Wuhan Univ, Sch Comp, State Key Lab Software Engn, Wuhan 430072, Hubei, Peoples R China.

IEEE TRANSACTIONS ON RELIABILITY, 2018; 67 (2): 581

Abstract

When there exist not enough historical defect data for building an accurate prediction model, semisupervised defect prediction (SSDP) and cross-projec......

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