An Improved CNN Model for Within-Project Software Defect Prediction

Pan, C; Lu, MY; Xu, B; Gao, HL

Pan, C; Lu, MY (reprint author), Beihang Univ, Key Lab Reliabil & Environm Engn Technol, Beijing 100191, Peoples R China.; Pan, C; Lu, MY (reprint author), Beihang Univ, Sch Reliabil & Syst Engn, Beijing 100191, Peoples R China.

APPLIED SCIENCES-BASEL, 2019; 9 (10):

Abstract

To improve software reliability, software defect prediction is used to find software bugs and prioritize testing efforts. Recently, some researchers i......

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