Soft Error Reliability Evaluation of Nanoscale Logic Circuits in the Presence of Multiple Transient Faults

Cai, S; He, BY; Wang, WZ; Liu, P; Yu, F; Yin, LR; Li, B

Cai, S (corresponding author), Changsha Univ Sci & Technol, Sch Comp & Commun Engn, Changsha 410114, Hunan, Peoples R China.

JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2020; 36 (4): 469

Abstract

Radiation-induced single transient faults (STFs) are expected to evolve into multiple transient faults (MTFs) at nanoscale CMOS technology nodes. For ......

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