An Analytic Model for Predicting Single Event (SE) Crosstalk of Nanometer CMOS Circuits

Liu, BJ; Cai, L; Liu, XQ

Liu, BJ (corresponding author), Air Force Engn Univ, Aviat Maintenance NCO Acad, Xinyang 464000, Henan, Peoples R China.

JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2020; 36 (4): 461

Abstract

With the technology node scaling down into nanometer range, the effect of parasitic inductance and capacitance between the interconnect lines on predi......

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