Fault Diagnosis Method of Low Noise Amplifier Based on Support Vector Machine and Hidden Markov Model

Sun, L; Li, Y; Du, H; Liang, PP; Nian, FS

Li, Y (corresponding author), Xidian Univ, Sch Mech & Elect Engn, Xian 710071, Shaanxi, Peoples R China.

JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2021; 37 (2): 215