Deterministic Path Delay Measurement Using Short Cycle Test Pattern

Kato, K

Kato, K (reprint author), Tsuruoka Coll, Natl Inst Technol, Dept Creat Engn, Yamagata 9970250, Japan.

2017 IEEE 26TH ASIAN TEST SYMPOSIUM (ATS), 2017; ( ): 146

Abstract

Short cycle test pattern can sensitize target paths deterministically and periodically in short interval. It is useful to apply the short cycle test p......

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