Scanning Line Probe Microscopy: Beyond the Point Probe

O'Neil, GD; Kuo, HW; Lomax, DN; Wright, J; Esposito, DV

Esposito, DV (reprint author), Columbia Univ City New York, Dept Chem Engn, New York, NY 10027 USA.; Wright, J (reprint author), Columbia Univ City New York, Data Sci Inst, Dept Elect Engn, New York, NY 10027 USA.

ANALYTICAL CHEMISTRY, 2018; 90 (19): 11531

Abstract

Scanning probe microscopy (SPM) techniques have become indispensable tools for studying nano- and microscale materials and processes but suffer from a......

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