Smart Redundancy Schemes for ANNs Against Fault Attacks

Koylu, TC; Hamdioui, S; Taouil, M

Koylu, TC (通讯作者),Delft Univ Technol, Comp Engn Grp, Delft, Netherlands.

2022 IEEE EUROPEAN TEST SYMPOSIUM (ETS 2022), 2022; ():