Atomistic mechanism for vacancy-enhanced grain boundary migration

Chen, DK; Xu, SZ; Kulkarni, Y

Kulkarni, Y (corresponding author), Univ Houston, Dept Mech Engn, Houston, TX 77004 USA.

PHYSICAL REVIEW MATERIALS, 2020; 4 (3):

Abstract

Mechanical behavior of polycrystalline materials is intimately connected to migration of grain boundaries, which in turn is dramatically impacted by t......

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