Using resistivity or logarithm of resistivity to calculate depth of investigation index to assess reliability of electrical resistivity tomography

Carriere, SD; Chalikakis, K; Danquigny, C; Torres-Rondon, L

Carriere, SD (reprint author), INRA UAPV, UMR EMMAH 1114, Avignon, France.

GEOPHYSICS, 2017; 82 (5): EN93

Abstract

We have conducted a comparative study to determine the most efficient and reliable way to calculate the depth of investigation (DOI) index to assess t......

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