Abnormal Two-Stage Degradation on P-Type Low-Temperature Polycrystalline-Silicon Thin-Film Transistor Under Hot Carrier Conditions

Tu, HY; Chang, TC; Tsao, YC; Tai, MC; Zheng, YZ; Tu, YF; Kuo, CW; Wu, CC; Tsai, YL; Tsai, TM; Lin, CC; Chien, YT

Chang, TC (通讯作者)，Natl Sun Yat Sen Univ, Dept Phys, Kaohsiung 80424, Taiwan.;Chang, TC (通讯作者)，Natl Sun Yat Sen Univ, Ctr Crystal Res, Kaohsiung 80424, Taiwan.

IEEE ELECTRON DEVICE LETTERS, 2022; 43 (5): 721

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