Photometric Depth Super-Resolution

Haefner, B; Peng, SY; Verma, A; Queau, Y; Cremers, D

Haefner, B (corresponding author), Tech Univ Munich, Dept Comp Sci, D-80333 Munich, Germany.

IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, 2020; 42 (10): 2453

Abstract

This study explores the use of photometric techniques (shape-from-shading and uncalibrated photometric stereo) for upsampling the low-resolution depth......

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