Hardness-Aware Deep Metric Learning

Zheng, WZ; Lu, JW; Zhou, J

Lu, JW (corresponding author), Beijing Natl Res Ctr Informat Sci & Technol BNRis, State Key Lab Intelligent Technol & Syst, Beijing 100084, Peoples R China.; Lu, JW (corresponding author), Tsinghua Univ, Dept Automat, Beijing 100084, Peoples R China.

IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, 2021; 43 (9): 3214