Improvised Long Test Lengths via Stitching Scale Bar Method: Performance Evaluation of Terrestrial Laser Scanners per ASTM E3125-17

Shi, SD; Muralikrishnan, B; Lee, V; Sawyer, D; Icasio-Hernandez, O

Shi, SD (corresponding author), Tianjin Univ, State Key Lab Precis Measuring Technol & Instrume, Tianjin 300072, Peoples R China.; Shi, SD (corresponding author), NIST, Gaithersburg, MD 20899 USA.

JOURNAL OF RESEARCH OF THE NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY, 2020; 125 ():