Influences of circuit mismatch on Paralleling Silicon Carbide MOSFETs

Qin, HH; Zhang, Y; Zhu, ZY; Wang, D; Fu, DF; Wang, SS; Zhao, CH

Qin, HH (reprint author), Nanjing Univ Aeronaut & Astronaut, Ctr More Elect Aircraft Power Syst, Nanjing, Jiangsu, Peoples R China.

PROCEEDINGS OF THE 2017 12TH IEEE CONFERENCE ON INDUSTRIAL ELECTRONICS AND APPLICATIONS (ICIEA), 2017; ( ): 556

Abstract

Current sharing is a major problem for paralleling devices, which can affect the performance and reliability of devices. In this paper, the factors le......

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