Materials Fingerprinting Classification

Spannaus, A; Law, KJH; Luszczek, P; Nasrin, F; Micucci, CP; Liaw, PK; Santodonato, LJ; Keffer, DJ; Maroulas, V

Keffer, DJ (corresponding author), Univ Tennessee, Dept Mat Sci & Engn, Knoxville, TN 37996 USA.; Maroulas, V (corresponding author), Univ Tennessee, Dept Math, Knoxville, TN 37996 USA.

COMPUTER PHYSICS COMMUNICATIONS, 2021; 266 ():

Abstract

Significant progress in many classes of materials could be made with the availability of experimentallyderived large datasets composed of atomic ident......

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