Angelic Patches for Improving Third-Party Object Detector Performance

Si, WW; Li, S; Park, S; Lee, I; Bastani, O

Si, WW (通讯作者),Univ Penn, Dept Comp & Info Sci, Philadelphia, PA 19104 USA.

2023 IEEE/CVF CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION (CVPR), 2023; (): 24638

Abstract

Deep learning models have shown extreme vulnerability to distribution shifts such as synthetic perturbations and spatial transformations. In this work......

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