Adaptive defect simulation flow for Defect-oriented Test evaluation

Gutierrez, V; Leger, G

Gutierrez, V (reprint author), Univ Seville, CSIC, Inst Microelect Sevilla, Av Amer Vespucio 28, Seville 41092, Spain.

2019 16TH INTERNATIONAL CONFERENCE ON SYNTHESIS, MODELING, ANALYSIS AND SIMULATION METHODS AND APPLICATIONS TO CIRCUIT DESIGN (SMACD 2019), 2019; (): 65

Abstract

For AMS-RF circuits, functional test is usually considered the best way to test a circuit. By construction, it should detect any fault (i.e. performan......

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