Regularized Semi-Supervised Metric Learning with Latent Structure Preserved

Wang, QY; Lu, M; Li, M; Guan, F

Lu, M (corresponding author), Hebei Normal Univ, Sch Math Sci, Shijiazhuang 050000, Hebei, Peoples R China.

INTERNATIONAL JOURNAL OF COMPUTATIONAL INTELLIGENCE AND APPLICATIONS, 2021; 20 (02):

Abstract

Metric learning is a critical problem in classification. Most classifiers are based on a metric, the simplest one is the KNN classifier, whose outcome......

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