Nanowire Detection in AFM Images Using Deep Learning

Bai, HT; Wu, S

Wu, S (corresponding author), Tianjin Univ, State Key Lab Precis Measurement Technol & Instru, Tianjin 300072, Peoples R China.; Wu, S (corresponding author), Tianjin Univ, Nanchang Inst Microtechnol, Tianjin 300072, Peoples R China.

MICROSCOPY AND MICROANALYSIS, 2021; 27 (1): 54

Abstract

Atomic force microscope (AFM) based nanomanipulation has been proved to be a possible way to assemble various nanoparticles into complex patterns and ......

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