Multi-Attributed Graph Matching With Multi-Layer Graph Structure and Multi-Layer Random Walks

Park, HM; Yoon, KJ

Yoon, KJ (reprint author), Korea Adv Inst Sci & Technol, Dept Mech Engn, Daejeon 34141, South Korea.

IEEE TRANSACTIONS ON IMAGE PROCESSING, 2018; 27 (5): 2314