Accurate Reliability Boundary Evaluation of Approximate Arithmetic Circuit

Wang, Z; Zhang, GF; Liu, P; Ye, J; Jiang, JH

Wang, Z (通讯作者)，Shanghai Univ Elect Power, Sch Comp Sci & Technol, Shanghai 200090, Peoples R China.;Liu, P (通讯作者)，Guangdong Univ Technol, Sch Comp, Guangzhou 510006, Peoples R China.

IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2022; 30 (10): 1507

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