SIFTing Through Scales

Hassner, T; Filosof, S; Mayzels, V; Zelnik-Manor, L

Hassner, T (reprint author), Open Univ Israel, Dept Math & Comp Sci, IL-4353701 Raanana, Israel.

IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, 2017; 39 (7): 1431

Abstract

Scale invariant feature detectors often find stable scales in only a few image pixels. Consequently, methods for feature matching typically choose one......

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