Improving Drain-Induced Barrier Lowering Effect and Hot Carrier Reliability With Terminal via Structure on Half-Corbino Organic Thin-Film Transistors-MedSci.cn

Improving Drain-Induced Barrier Lowering Effect and Hot Carrier Reliability With Terminal via Structure on Half-Corbino Organic Thin-Film Transistors

Hung, YH; Chang, TC; Tu, YF; Lu, IN; Zheng, YZ; Chiang, CL; Chen, JJ; Kuo, CW; Sun, LC; Zhou, KJ

Chang, TC (通讯作者)，Natl Sun Yat Sen Univ, Dept Phys, Kaohsiung 80424, Taiwan.

IEEE ELECTRON DEVICE LETTERS, 2022; 43 (4): 569

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