Dynamics of transient hole doping in epitaxial graphene

Mhatre, SM; Tran, NTM; Hill, HM; Saha, D; Walker, ARH; Liang, CT; Elmquist, RE; Newell, DB; Rigosi, AF

Rigosi, AF (通讯作者)，Natl Inst Stand & Technol NIST, Phys Measurement Lab, Gaithersburg, MD 20899 USA.

PHYSICAL REVIEW B, 2022; 105 (20):

Abstract

Full Text Link


Links

期刊讨论 | 中国SCI论文 | 期刊主页 | 投稿经验 | 杂志官网 | 投稿链接 | 作者需知 | PMC链接 | Pubmed全文检索