Reliability Evaluation under Accelerated Degradation Testing with Recovery Capability Considered

Wang, CJ; Hu, QP; Yu, D

Wang, CJ (reprint author), Chinese Acad Sci, Acad Math & Syst Sci, 55 East Zhongguancun Rd, Beijing, Peoples R China.

2019 ANNUAL RELIABILITY AND MAINTAINABILITY SYMPOSIUM (RAMS 2019) - R & M IN THE SECOND MACHINE AGE - THE CHALLENGE OF CYBER PHYSICAL SYSTEM, 2019; ():

Abstract

Degradation data always contains useful information on life and reliability, even if no failure has occurred. By applying additional stress, accelerat......

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