On-chip interrogator based on Fourier transform spectroscopy

Peternella, FG; Esselink, T; Dorsman, B; Harmsma, P; Horsten, RC; Zuidwi, T; Urbach, HP; Adam, ALC

Peternella, FG (reprint author), Delft Univ Technol, ImPhys Dept, Mekelweg 5, NL-2628 CD Delft, Netherlands.

OPTICS EXPRESS, 2019; 27 (11): 15456

Abstract

In this paper, the design and the characterization of a novel interrogator based on integrated Fourier transform (FT) spectroscopy is presented. To th......

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