Binary image deblurring with automatic binary value estimation

Lv, XG; Li, F

Li, F (reprint author), East China Normal Univ, Shanghai Key Lab PMMP, Sch Math Sci, Shanghai, Peoples R China.

JOURNAL OF ELECTRONIC IMAGING, 2018; 27 (3):

Abstract

We propose a total variation-based variational model for nonblind binary image deblurring. The binary constraint is considered using the double-well f......

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