The Wide Diameter and Fault Diameter of Exchanged Crossed Cube

Niu, BH; Zhou, SM; Tian, T; Zhang, QF

Zhou, SM (通讯作者),Fujian Normal Univ, Key Lab Analyt Math & Applicat, Minist Educ, Fuzhou 350117, Fujian, Peoples R China.

INTERNATIONAL JOURNAL OF FOUNDATIONS OF COMPUTER SCIENCE, 2023; ():

Abstract

The fault diameter and wide diameter are commonly used to measure the fault tolerance and transmission delay of interconnection networks beyond tradit......

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