Competition between heating and cooling during dynamic self-heating degradation of amorphous InGaZnO thin-film transistors

Zhou, YH; Liu, FY; Yang, H; Zhou, XL; Li, GJ; Zhang, M; Chen, RS; Zhang, SD; Lu, L

Zhang, SD; Lu, L (通讯作者)，Peking Univ, Sch Elect & Comp Engn, Shenzhen Grad Sch, Shenzhen 518055, Peoples R China.

SOLID-STATE ELECTRONICS, 2022; 195 ():

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