Incomplete Testing of SOC

Singh, KM; Deka, J; Biswas, S

Singh, KM (通讯作者),IIT, Dept Comp Sci, Gauhati 781039, Assam, India.

JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2023; 39 (3): 387

Abstract

Nowadays, System on Chip (SOC) based devices such as smartphones, tablets, cameras, and others are commonly used. The cost of these devices is determi......

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