Soft-type trap-induced degradation of MoS2 field effect transistors

Cho, YH; Ryu, MY; Lee, KJ; Park, SJ; Choi, JH; Lee, BC; Kim, W; Kim, GT

Kim, GT (reprint author), Korea Univ, Sch Elect Engn, Seoul 02841, South Korea.

NANOTECHNOLOGY, 2018; 29 (22):