The Duality of Ray-Based and Pinhole-Camera Modeling and 3D Measurement Improvements Using the Ray-Based Model

Brauer-Burchardt, C; Ramm, R; Kuhmstedt, P; Notni, G

Brauer-Burchardt, C (通讯作者)，Fraunhofer Inst Appl Opt & Precis Engn IOF, Dept Imaging & Sensing, Albert Einstein Str 7, D-07745 Jena, Germany.

SENSORS, 2022; 22 (19):

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