Deep k-Means: Jointly clustering with k-Means and learning representations

Fard, MM; Thonet, T; Gaussier, E

Thonet, T (corresponding author), NAVER LABS Europe, F-38240 Meylan, France.

PATTERN RECOGNITION LETTERS, 2020; 138 (): 185

Abstract

We study in this paper the problem of jointly clustering and learning representations. As several previous studies have shown, learning representation......

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