Improving Test and Diagnosis Efficiency through Ensemble Reduction and Learning

Wang, HF; He, K

He, K (reprint author), Huazhong Univ Sci & Technol, Sch Comp Sci & Technol, Wuhan 430074, Hubei, Peoples R China.

ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS, 2019; 24 (5):