Uncertainty of the Ohm Using Cryogenic and Non-Cryogenic Bridges

Panna, AR; Kraft, ME; Rigosi, AF; Jones, GR; Payagala, SU; Kruskopf, M; Jarrett, DG; Elmquist, RE

Panna, AR (reprint author), NIST, 100 Bur Dr,Stop 8171, Gaithersburg, MD 20899 USA.

2018 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS (CPEM 2018), 2018; ():

Abstract

We describe recent scaling measurements to decade resistance levels based on both cryogenic and non-cryogenic current comparator bridges. National mea......

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