Adversarial Perturbation Attacks on ML-based CAD: A Case Study on CNN-based Lithographic Hotspot Detection

Liu, K; Yang, HY; Ma, YZ; Tan, B; Yu, B; Young, EFY; Karri, R; Garg, S

Liu, K (corresponding author), NYU, Tandon Sch Engn, Ctr Cybersecur, 370 Jay St, Brooklyn, NY 11201 USA.

ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS, 2020; 25 (5):

Abstract

There is substantial interest in the use of machine learning (ML)-based techniques throughout the electronic computer-aided design (CAD) flow, particu......

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