Design of node separated triple-node-upset self-recoverable latch

Huang, ZF; Cao, D; Cui, JG; Lu, YC; Liang, HG; Ouyang, YM; Ni, TM; Li, ZN

Li, ZN (corresponding author), Hefei Univ Technol, Sch Microelect, Hefei, Peoples R China.

MICROELECTRONICS JOURNAL, 2021; 114 ():

Abstract

With the continuous scaling of IC technology, latches becomes more vulnerable to double-node-upset (DNU) and triple-node-upset (TNU). The node separat......

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