Active shape from projection defocus profilometry

Zheng, Y; Wang, YJ; Li, BW

Li, BW (corresponding author), Iowa State Univ, Dept Mech Engn, Ames, IA 50011 USA.; Wang, YJ (corresponding author), Wuhan Univ, State Key Lab Informat Engn Surveying Mapping & R, Wuhan 430079, Peoples R China.

OPTICS AND LASERS IN ENGINEERING, 2020; 134 ():

Abstract

Fringe projection profilometry (FPP) using a vertical scanning setup has the merit of avoiding occlusions and shadows over triangulation based approac......

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