Combination of direct, half-skip and full-skip TFM to characterize defect (II)

Han, XL; Wu, WT; Zhang, D; Wan, HT

Han, XL (reprint author), Chinese Acad Sci, Inst Acoust, Beijing, Peoples R China.

2019 IEEE INTERNATIONAL ULTRASONICS SYMPOSIUM (IUS), 2019; (): 1612

Abstract

To improve the accuracy of defect quantification, especially for those defects with a certain extension length, the ultrasonic echo information return......

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