Edge enhanced morphology for infrared image analysis

Bai, XZ; Liu, HN

Bai, XZ (reprint author), Beijing Univ Aeronaut & Astronaut, Image Proc Ctr, Beijing 100191, Peoples R China.

INFRARED PHYSICS & TECHNOLOGY, 2017; 80 ( ): 44

Abstract

Edge information is one of the critical information for infrared images. Morphological operators have been widely used for infrared image analysis. Ho......

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