Counteracting Malicious Faults in Cryptographic Circuits

Polian, I; Regazzoni, F

Polian, I (reprint author), Univ Passau, Fac Comp Sci & Math, Passau, Germany.

2017 22ND IEEE EUROPEAN TEST SYMPOSIUM (ETS), 2017; ( ):

Abstract

In the area of testing, faults represent defects that occur during circuit manufacturing, or transient disturbances due to radiation or noise. This pa......

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