Dissolution Rate Monitor Tool to Measure EUV Photoresist Dissolution

Vesters, Y; De Simone, D; De Gendt, S

De Simone, D (reprint author), IMEC, Kapeldreef 75, B-3001 Leuven, Belgium.

JOURNAL OF PHOTOPOLYMER SCIENCE AND TECHNOLOGY, 2017; 30 (6): 675

Abstract

The resist development step in photolithography is a complex process involving selective dissolution between exposed and unexposed photoresist. This p......

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