Multibeam Electron Diffraction

Hong, XH; Zeltmann, SE; Savitzky, BH; DaCosta, LR; Muller, A; Minor, AM; Bustillo, KC; Ophus, C

Ophus, C (corresponding author), Lawrence Berkeley Natl Lab, Natl Ctr Electron Microscopy, Mol Foundry, 1 Cyclotron Rd, Berkeley, CA 94720 USA.

MICROSCOPY AND MICROANALYSIS, 2021; 27 (1): 129

Abstract

One of the primary uses for transmission electron microscopy (TEM) is to measure diffraction pattern images in order to determine a crystal structure ......

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