Phase Estimation of Illumination Pattern in Structured Illumination Microscopy

Pospisil, J; Fliegei, K; Klima, M

Pospisil, J (reprint author), Czech Tech Univ, Dept Radioelect, FEE, Prague, Czech Republic.

2017 27TH INTERNATIONAL CONFERENCE RADIOELEKTRONIKA (RADIOELEKTRONIKA), 2017; ( ): 174

Abstract

Conventional structured illumination microscopy (SIM) methods require precise knowledge of the illumination pattern and assume the sampIe to be statio......

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